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EN_40_170_114 | CZ 04-2018 | Design, scope of delivery and technical progress subject to change without notice. | © Carl Zeiss Microscopy GmbH
Microscopy Lab Floor Plan
Discover how you will gain insights into your samples in this materials microscopy lab. Move from room to room: find ways to address your multi-scale and multi-modal research challenges, and gain a better understanding of your samples to help you design future materials.
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Reach new levels of nanofabrication and nanoscale imaging with helium ion microscopy
- Switch between three focused ion beams (gallium, neon, and helium) to perform milling and fabrication tasks across a range of lengthscales
- Create structures smaller than 10 nm, such as for plasmonic, photonic, or semiconductor devices
- Use He to perform sub-nm imaging even on nonconductive surfaces
Understanding material properties with light microscopy
- Analyze metal samples to evaluate grain size, non-metallic inclusions, voids, or other heterogeneities
- Observe and measure distributions of multiple solid phases
- Perform inspection of engineering parts or devices with digital and zoom microscopes
Master your multi-scale challenge
- Utilize correlative workflows to apply several microscopy techniques to a single sample
- Carefully target and navigate to specific regions of interest at increasing levels of resolution
- Correlate microstructures using different modalities in 2D, but also 3D as well
Revolutionize the speed of electron microscopy with MultiSEM
- Use up to 91 parallel electron beams to image cm-sized areas at nanoscale resolution
- Automate protocols to make imaging incredibly large areas a routine task
- Gain robust microstructural statistics across a very extensive area
Meet an expert in 3D and 4D imaging for materials science, explore unique opportunities with X-ray microscopy
- Perform quantification of 3D structures such as porous media, energy devices, or composite materials
- Study 3D deformation at micro and nano-scale under mechanical load
- Unlock crystallographic information using LabDCT 3D grain mapping
Advance your capabilities in 3D analysis and sample preparation with FIB-SEMs
- Perform tomography, with analytics, to study 3D micro and nanostructures
- Streamline sample preparation tasks including TEM samples, micropillars, cantilevers, and more
- Use the ion beam for high precision nanopatterning and nanofabrication tasks for functional materials
Effortlessly image and analyze any sample with field emission SEMs
- Use high performance low kV imaging to examine a wide variety of sample types with multiple contrast methods
- Analyze your materials with EDS, WDS, EBSD, integrated Raman, and more
- Incorporate in situ stages and devices to understand links to material deformation or properties
Leverage digital solutions to maximize the information you extract from your samples
- Use advanced image segmentation tools built on machine learning algorithms to move beyond images to quantifiable data
- Enhance your acquisition, data correlation, and understanding that you obtain from multi-modal and multi-scale imaging workflows
- Use image processing and analysis tools to measure characteristics such as grain sizes, layer thicknesses, or inclusion properties